技術優勢1、PMT高靈敏度檢測器(qi)；2、可搭(da)(da)配不同(tong)功率光源；3、雙(shuang)列(lie)直插式電極和(he)樣品(pin)池，可反復使用成千上萬(wan)次；4、鈀電極；5、精(jing)確度高，接近樣品(pin)真實(shi)值；6、復合(he)型(xing)算(suan)法(fa)(fa)：高斯（Gaussion）單峰(feng)算(suan)法(fa)(fa)與(yu)Nicomp多(duo)峰(feng)算(suan)法(fa)(fa)自由切換(huan)；相位(wei)分(fen)(fen)析法(fa)(fa)（PALS)和(he)頻譜(pu)分(fen)(fen)析法(fa)(fa)（FALS）自由切換(huan)；7、快速檢測，可以追(zhui)溯歷史數據；8、結果數據以多(duo)種形式和(he)格式呈現；9、符合(he)USP,CP等(deng)個多(duo)藥典要(yao)求；10、無(wu)需校(xiao)準；11、模(mo)塊化設計(ji)便于維護和(he)升級；（1）可自動稀(xi)釋模(mo)塊（選配）；（2）搭(da)(da)配多(duo)角度檢測器(qi)（選配）；（3）自動進樣系(xi)統(tong)（選配）；Nicomp 380 系(xi)列(lie)納米激光粒(li)度儀(yi) 專為(wei)復雜體系(xi)提供高精(jing)度粒(li)度解(jie)析方案(an)。廣東(dong)常見zeta電位(wei)及納米粒(li)度儀(yi)技術指導

Nicomp多(duo)峰(feng)(feng)分(fen)(fen)(fen)(fen)(fen)(fen)布(bu)(bu)概(gai)念(nian)：基(ji)線調整(zheng)自(zi)動補償功能和(he)高(gao)分(fen)(fen)(fen)(fen)(fen)(fen)辨率(lv)多(duo)峰(feng)(feng)算(suan)法(fa)是Nicomp380系(xi)(xi)列儀(yi)(yi)器的(de)(de)(de)兩個主要特點，Nicomp創(chuang)始(shi)人DaveNicole很早就認識到傳統(tong)的(de)(de)(de)動態光(guang)(guang)散射(she)理(li)論(lun)只給出高(gao)斯模式(shi)(shi)的(de)(de)(de)粒(li)度(du)分(fen)(fen)(fen)(fen)(fen)(fen)布(bu)(bu)，這(zhe)和(he)實(shi)(shi)踐生產生活中(zhong)不(bu)相符，因為現(xian)實(shi)(shi)中(zhong)很多(duo)樣本是多(duo)分(fen)(fen)(fen)(fen)(fen)(fen)散體(ti)系(xi)(xi)，非單分(fen)(fen)(fen)(fen)(fen)(fen)散體(ti)系(xi)(xi)，而(er)且高(gao)斯分(fen)(fen)(fen)(fen)(fen)(fen)布(bu)(bu)靈敏(min)性(xing)不(bu)足，分(fen)(fen)(fen)(fen)(fen)(fen)辨率(lv)不(bu)高(gao)，這(zhe)些特點都制(zhi)約了納(na)米(mi)粒(li)度(du)儀(yi)(yi)在實(shi)(shi)際生產生活中(zhong)的(de)(de)(de)使(shi)用(yong)。其開(kai)創(chuang)的(de)(de)(de)Nicomp多(duo)峰(feng)(feng)分(fen)(fen)(fen)(fen)(fen)(fen)布(bu)(bu)理(li)論(lun)，提高(gao)了動態光(guang)(guang)散射(she)理(li)論(lun)的(de)(de)(de)分(fen)(fen)(fen)(fen)(fen)(fen)辨率(lv)和(he)靈敏(min)性(xing)。Nicomp多(duo)峰(feng)(feng)分(fen)(fen)(fen)(fen)(fen)(fen)布(bu)(bu)優(you)勢Nicomp系(xi)(xi)列儀(yi)(yi)器均可以(yi)(yi)(yi)自(zi)由在Gaussian分(fen)(fen)(fen)(fen)(fen)(fen)布(bu)(bu)模式(shi)(shi)和(he)Nicomp多(duo)峰(feng)(feng)分(fen)(fen)(fen)(fen)(fen)(fen)布(bu)(bu)模式(shi)(shi)中(zhong)切換。其不(bu)只可以(yi)(yi)(yi)給出傳統(tong)的(de)(de)(de)DLS系(xi)(xi)統(tong)的(de)(de)(de)結(jie)果，更可以(yi)(yi)(yi)通過Nicomp多(duo)峰(feng)(feng)分(fen)(fen)(fen)(fen)(fen)(fen)布(bu)(bu)模式(shi)(shi)體(ti)現(xian)樣品的(de)(de)(de)真實(shi)(shi)情況。依(yi)托于Nicomp系(xi)(xi)列儀(yi)(yi)器一(yi)系(xi)(xi)列優(you)異的(de)(de)(de)算(suan)法(fa)和(he)高(gao)靈敏(min)性(xing)的(de)(de)(de)硬件設計，Nicomp納(na)米(mi)激(ji)光(guang)(guang)粒(li)度(du)儀(yi)(yi)可以(yi)(yi)(yi)有效區分(fen)(fen)(fen)(fen)(fen)(fen)1:2的(de)(de)(de)多(duo)分(fen)(fen)(fen)(fen)(fen)(fen)散體(ti)系(xi)(xi)。zeta電(dian)位及(ji)納(na)米(mi)粒(li)度(du)儀(yi)(yi)售(shou)后服務技(ji)術優(you)勢：3、雙列直(zhi)插式(shi)(shi)電(dian)極和(he)樣品池(chi)，可反復使(shi)用(yong)成千上萬次。

Nicomp多(duo)峰(feng)分(fen)(fen)(fen)布(bu)概(gai)念：基(ji)線調整自(zi)(zi)動(dong)補償功能和(he)高(gao)(gao)分(fen)(fen)(fen)辨率(lv)多(duo)峰(feng)算(suan)法是Nicomp380系(xi)(xi)列儀(yi)器(qi)的(de)兩個(ge)主要特點，Nicomp創始(shi)人(ren)DaveNicole很早就認識到傳統的(de)動(dong)態光散(san)射理論(lun)只(zhi)給出高(gao)(gao)斯模式的(de)粒度分(fen)(fen)(fen)布(bu)，這和(he)實(shi)踐生產(chan)生活中不(bu)相符(fu)，因(yin)為(wei)現實(shi)中很多(duo)樣本是多(duo)分(fen)(fen)(fen)散(san)體(ti)系(xi)(xi)，非(fei)單分(fen)(fen)(fen)散(san)體(ti)系(xi)(xi)，而且高(gao)(gao)斯分(fen)(fen)(fen)布(bu)靈敏性(xing)不(bu)足(zu)，分(fen)(fen)(fen)辨率(lv)不(bu)高(gao)(gao)，這些特點都制約(yue)了納(na)(na)米粒度儀(yi)在(zai)實(shi)際生產(chan)生活中的(de)使用(yong)。其(qi)開創的(de)Nicomp多(duo)峰(feng)分(fen)(fen)(fen)布(bu)理論(lun)，提高(gao)(gao)了動(dong)態光散(san)射理論(lun)的(de)分(fen)(fen)(fen)辨率(lv)和(he)靈敏性(xing)。Nicomp多(duo)峰(feng)分(fen)(fen)(fen)布(bu)優勢Nicomp系(xi)(xi)列儀(yi)器(qi)均可(ke)以自(zi)(zi)由在(zai)Gaussian分(fen)(fen)(fen)布(bu)模式和(he)Nicomp多(duo)峰(feng)分(fen)(fen)(fen)布(bu)模式中切換。其(qi)不(bu)只(zhi)可(ke)以給出傳統的(de)DLS系(xi)(xi)統的(de)結果(guo)，更可(ke)以通過(guo)Nicomp多(duo)峰(feng)分(fen)(fen)(fen)布(bu)模式體(ti)現樣品的(de)真(zhen)實(shi)情況。依托(tuo)于Nicomp系(xi)(xi)列儀(yi)器(qi)一系(xi)(xi)列優異的(de)算(suan)法和(he)高(gao)(gao)靈敏性(xing)的(de)硬件設計，Nicomp納(na)(na)米激光粒度儀(yi)可(ke)以有效區分(fen)(fen)(fen)1:2的(de)多(duo)分(fen)(fen)(fen)散(san)體(ti)系(xi)(xi)。

Zeta電(dian)(dian)(dian)(dian)(dian)(dian)(dian)勢(shi)(shi)(shi)(shi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)原(yuan)理1.什么是(shi)(shi)(shi)ZETA電(dian)(dian)(dian)(dian)(dian)(dian)(dian)勢(shi)(shi)(shi)(shi)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)：Zeta電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)（Zetapotential）是(shi)(shi)(shi)指剪切(qie)面(ShearPlane)的(de)(de)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)，又(you)叫電(dian)(dian)(dian)(dian)(dian)(dian)(dian)動(dong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)或(huo)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)動(dong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)勢(shi)(shi)(shi)(shi)（ζ-電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)或(huo)ζ-電(dian)(dian)(dian)(dian)(dian)(dian)(dian)勢(shi)(shi)(shi)(shi)），是(shi)(shi)(shi)表(biao)(biao)征膠(jiao)體分散系穩定性的(de)(de)重(zhong)要指標。2.STERN雙(shuang)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)子(zi)層：膠(jiao)核(he)表(biao)(biao)面擁有一層離(li)(li)(li)(li)子(zi)，稱為(wei)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)離(li)(li)(li)(li)子(zi)，電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)離(li)(li)(li)(li)子(zi)通過靜電(dian)(dian)(dian)(dian)(dian)(dian)(dian)作用，把溶液中電(dian)(dian)(dian)(dian)(dian)(dian)(dian)荷相反的(de)(de)離(li)(li)(li)(li)子(zi)吸(xi)(xi)引到膠(jiao)核(he)周(zhou)圍，被吸(xi)(xi)引的(de)(de)離(li)(li)(li)(li)子(zi)稱為(wei)反離(li)(li)(li)(li)子(zi)，越(yue)(yue)靠(kao)近膠(jiao)核(he)表(biao)(biao)面的(de)(de)地方(fang)反離(li)(li)(li)(li)子(zi)越(yue)(yue)密集，相反，越(yue)(yue)遠(yuan)的(de)(de)地方(fang)反離(li)(li)(li)(li)子(zi)越(yue)(yue)稀疏(shu)，他(ta)們的(de)(de)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)荷總量與電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)離(li)(li)(li)(li)子(zi)相等并(bing)且符號相反。因(yin)此，整個膠(jiao)團是(shi)(shi)(shi)處于電(dian)(dian)(dian)(dian)(dian)(dian)(dian)中性狀(zhuang)態，而膠(jiao)核(he)表(biao)(biao)面電(dian)(dian)(dian)(dian)(dian)(dian)(dian)勢(shi)(shi)(shi)(shi)是(shi)(shi)(shi)醉高(gao)的(de)(de)，根據定義(yi)Zeta電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)即為(wei)膠(jiao)核(he)表(biao)(biao)面電(dian)(dian)(dian)(dian)(dian)(dian)(dian)勢(shi)(shi)(shi)(shi)。3.DLS散射系統(tong)如何測ZETA電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)：目前(qian)測量ZETA電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)的(de)(de)方(fang)法主(zhu)要有電(dian)(dian)(dian)(dian)(dian)(dian)(dian)泳法、電(dian)(dian)(dian)(dian)(dian)(dian)(dian)滲法、流動(dong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)法以及超聲波法。NicompZ3000采用的(de)(de)是(shi)(shi)(shi)主(zhu)流的(de)(de)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)泳法測試ZETA。技術(shu)優勢(shi)(shi)(shi)(shi)：11、模塊化設計便于維護和升級(ji)； （1）可(ke)自動(dong)稀釋模塊（選(xuan)配）。

產品(pin)優勢(shi)：一(yi)、模(mo)塊(kuai)化設計(ji)：Nicomp380納(na)米(mi)激光(guang)粒(li)(li)度(du)儀(yi)(yi)是(shi)全球率先在(zai)應用(yong)動(dong)態光(guang)散射(she)技術(shu)上的(de)(de)(de)基礎上加入多模(mo)塊(kuai)方法的(de)(de)(de)先進粒(li)(li)度(du)儀(yi)(yi)。隨著模(mo)塊(kuai)的(de)(de)(de)升(sheng)級和增(zeng)加，Nicomp380的(de)(de)(de)功(gong)能體(ti)系(xi)越(yue)來(lai)越(yue)強(qiang)(qiang)大(da)(da)(da)(da)，可(ke)以用(yong)于各種復(fu)雜體(ti)系(xi)的(de)(de)(de)檢測(ce)(ce)(ce)分析。二、自(zi)動(dong)稀(xi)(xi)釋模(mo)塊(kuai)（選配）：自(zi)動(dong)稀(xi)(xi)釋模(mo)塊(kuai)消(xiao)除了人工稀(xi)(xi)釋高濃度(du)樣(yang)(yang)(yang)品(pin)帶來(lai)的(de)(de)(de)誤差，且(qie)不(bu)需要人工不(bu)斷試(shi)錯來(lai)獲得合(he)適的(de)(de)(de)測(ce)(ce)(ce)試(shi)濃度(du)，這縮短了測(ce)(ce)(ce)試(shi)者(zhe)寶貴時(shi)(shi)間，且(qie)無需培訓，測(ce)(ce)(ce)試(shi)結果(guo)重現性好，誤差率＜1%。 三、380/HPLD大(da)(da)(da)(da)功(gong)率激光(guang)器(qi)(qi)：美國PSS粒(li)(li)度(du)儀(yi)(yi)公司在(zai)開(kai)發儀(yi)(yi)器(qi)(qi)的(de)(de)(de)過程中，考慮到(dao)在(zai)各種極(ji)端實驗測(ce)(ce)(ce)試(shi)條(tiao)(tiao)件中不(bu)同(tong)的(de)(de)(de)需求，對不(bu)同(tong)使(shi)用(yong)條(tiao)(tiao)件和環境配置了不(bu)同(tong)功(gong)率的(de)(de)(de)激光(guang)發生器(qi)(qi)。大(da)(da)(da)(da)功(gong)率的(de)(de)(de)激光(guang)器(qi)(qi)可(ke)以對極(ji)小(xiao)的(de)(de)(de)粒(li)(li)子(zi)(zi)也(ye)能搜集到(dao)足(zu)夠的(de)(de)(de)散射(she)信號(hao)，使(shi)得儀(yi)(yi)器(qi)(qi)能夠得到(dao)極(ji)小(xiao)粒(li)(li)子(zi)(zi)的(de)(de)(de)粒(li)(li)徑分布(bu)。同(tong)樣(yang)(yang)(yang)，大(da)(da)(da)(da)功(gong)率激光(guang)器(qi)(qi)在(zai)測(ce)(ce)(ce)試(shi)大(da)(da)(da)(da)粒(li)(li)子(zi)(zi)的(de)(de)(de)時(shi)(shi)候同(tong)樣(yang)(yang)(yang)也(ye)很有幫(bang)助，比如在(zai)檢測(ce)(ce)(ce)右旋(xuan)糖酐大(da)(da)(da)(da)分子(zi)(zi)時(shi)(shi)，折(zhe)射(she)率的(de)(de)(de)特性會(hui)引起(qi)光(guang)散射(she)強(qiang)(qiang)度(du)不(bu)足(zu)。因為(wei)大(da)(da)(da)(da)功(gong)率激光(guang)器(qi)(qi)的(de)(de)(de)特性，會(hui)彌補散射(she)光(guang)強(qiang)(qiang)的(de)(de)(de)不(bu)足(zu)和衰(shuai)減，測(ce)(ce)(ce)試(shi)極(ji)其(qi)微小(xiao)的(de)(de)(de)微乳、表面活(huo)性劑膠束、蛋白質以及其(qi)他大(da)(da)(da)(da)分子(zi)(zi)不(bu)再是(shi)一(yi)個苛刻(ke)的(de)(de)(de)難題。即使(shi)沒有色譜分離，Nicomp380納(na)米(mi)粒(li)(li)徑分析儀(yi)(yi)甚至(zhi)也(ye)可(ke)以輕易估算出(chu)生物高分子(zi)(zi)的(de)(de)(de)聚(ju)集程度(du)。技術(shu)優勢(shi)：5、精確度(du)高，接近樣(yang)(yang)(yang)品(pin)真實值。廣東如何zeta電(dian)位及納(na)米(mi)粒(li)(li)度(du)儀(yi)(yi)銷售(shou)電(dian)話(hua)

即使沒(mei)有色譜分(fen)離(li)，Nicomp 380納(na)米(mi)粒徑分(fen)析(xi)儀甚(shen)至(zhi)也可(ke)以輕易(yi)估(gu)算(suan)出生物高分(fen)子的(de)聚集程度(du)。廣東常(chang)見zeta電位及納(na)米(mi)粒度(du)儀技(ji)術指導

Zeta電(dian)(dian)(dian)(dian)(dian)(dian)(dian)勢電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)(wei)(wei)(wei)原(yuan)理1.什么是ZETA電(dian)(dian)(dian)(dian)(dian)(dian)(dian)勢電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)(wei)(wei)(wei)：Zeta電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)(wei)(wei)(wei)（Zetapotential）是指(zhi)(zhi)剪(jian)切面(ShearPlane)的(de)(de)(de)(de)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)(wei)(wei)(wei)，又(you)叫電(dian)(dian)(dian)(dian)(dian)(dian)(dian)動(dong)(dong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)(wei)(wei)(wei)或電(dian)(dian)(dian)(dian)(dian)(dian)(dian)動(dong)(dong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)勢（ζ-電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)(wei)(wei)(wei)或ζ-電(dian)(dian)(dian)(dian)(dian)(dian)(dian)勢），是表(biao)征膠(jiao)體分散系穩定性(xing)的(de)(de)(de)(de)重(zhong)要指(zhi)(zhi)標。2.STERN雙(shuang)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)子(zi)(zi)層：膠(jiao)核(he)表(biao)面擁有一層離(li)子(zi)(zi)，稱為(wei)(wei)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)(wei)(wei)(wei)離(li)子(zi)(zi)，電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)(wei)(wei)(wei)離(li)子(zi)(zi)通(tong)過靜電(dian)(dian)(dian)(dian)(dian)(dian)(dian)作用，把(ba)溶液中電(dian)(dian)(dian)(dian)(dian)(dian)(dian)荷相反(fan)(fan)(fan)的(de)(de)(de)(de)離(li)子(zi)(zi)吸(xi)(xi)引到膠(jiao)核(he)周圍，被吸(xi)(xi)引的(de)(de)(de)(de)離(li)子(zi)(zi)稱為(wei)(wei)反(fan)(fan)(fan)離(li)子(zi)(zi)，越(yue)(yue)(yue)(yue)靠近膠(jiao)核(he)表(biao)面的(de)(de)(de)(de)地方(fang)反(fan)(fan)(fan)離(li)子(zi)(zi)越(yue)(yue)(yue)(yue)密(mi)集，相反(fan)(fan)(fan)，越(yue)(yue)(yue)(yue)遠的(de)(de)(de)(de)地方(fang)反(fan)(fan)(fan)離(li)子(zi)(zi)越(yue)(yue)(yue)(yue)稀疏，他們的(de)(de)(de)(de)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)荷總量與電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)(wei)(wei)(wei)離(li)子(zi)(zi)相等并(bing)且符(fu)號相反(fan)(fan)(fan)。因此，整個膠(jiao)團是處于電(dian)(dian)(dian)(dian)(dian)(dian)(dian)中性(xing)狀態，而膠(jiao)核(he)表(biao)面電(dian)(dian)(dian)(dian)(dian)(dian)(dian)勢是醉高(gao)的(de)(de)(de)(de)，根(gen)據定義Zeta電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)(wei)(wei)(wei)即為(wei)(wei)膠(jiao)核(he)表(biao)面電(dian)(dian)(dian)(dian)(dian)(dian)(dian)勢。3.DLS散射(she)系統如何測ZETA電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)(wei)(wei)(wei)：目前測量ZETA電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)(wei)(wei)(wei)的(de)(de)(de)(de)方(fang)法(fa)(fa)(fa)主要有電(dian)(dian)(dian)(dian)(dian)(dian)(dian)泳(yong)法(fa)(fa)(fa)、電(dian)(dian)(dian)(dian)(dian)(dian)(dian)滲法(fa)(fa)(fa)、流動(dong)(dong)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)(wei)(wei)(wei)法(fa)(fa)(fa)以及(ji)超聲波法(fa)(fa)(fa)。NicompZ3000采用的(de)(de)(de)(de)是主流的(de)(de)(de)(de)電(dian)(dian)(dian)(dian)(dian)(dian)(dian)泳(yong)法(fa)(fa)(fa)測試ZETA。廣東常(chang)見zeta電(dian)(dian)(dian)(dian)(dian)(dian)(dian)位(wei)(wei)(wei)(wei)(wei)(wei)及(ji)納米(mi)粒度儀技術(shu)指(zhi)(zhi)導

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